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| Ultra-X RAM Stress Test Pro Mapping Memory Errors or "Bits and Pieces" | |
| (Review by MS, December 6, 2001) |

Click for next picture
The test displays the memory array as a function of but width and aray depth. In other words, each data I/O pin on each chip is mapped to one of the hex numbers (horizontal lines) In reality, only one line is lit at the time, however, because of the shutter speed of the camera it appears that four lines are accessed simultaneously. Failing bits are shown in red. The top panel shows passed test patterns in green, failed tests in red. The situation shown was using one 32 MB and one 16 MB DIMM for a total of 48 MB and the system was overclocked until failures occurred.
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